摘要: This work examines the effects of heavy-ion irradiation on magnetic heterostructure thin film stacks, which constitute the core functional element of spin--orbit torque magnetic random access memory (SOT-MRAM). For advanced perpendicular magnetic anisotropy (PMA) SOT-MRAM thin films, 25 MeV/u Kr-ion irradiation experiments were performed with different fluences. Current-in-plane tunneling (CIPT) measurements indicate that, up to a fluence of 5 × 1011 ions/cm2, both the tunneling magnetoresistance (TMR) and the resistance--area product (RA) of the thin films exhibit negligible variation; when the ion fluence increases to 1 × 1012 ions/cm2, the TMR decreases by only ~ 5%, demonstrating robust electronic transport stability of the SOT-MRAM thin films under low-to-moderate fluence irradiation. The alternating gradient magnetometer (AGM) measurements indicate that, after irradiation, the saturation magnetization and the remanent magnetization of the thin films increase markedly, whereas the coercivity exhibits a decreasing trend with increasing fluence, indicating that irradiation alters magnetization reversal and pinning behavior. Microstructural characterizations indicate that irradiation-induced changes are predominantly concentrated in the MgO barrier layer and its interfaces: at high fluence, MgO lattice fringes become disordered, intermixing at the MgO/CoFeB interface is enhanced, and the Mg-related region broadens, with the full width at half maximum (FWHM) of the Mg distribution increasing from 1.48 ± 0.15 nm to 1.76 ± 0.19 nm. In contrast, the CoFeB ferromagnetic layer retains comparatively good structural and compositional stability. These findings provide material-level experimental evidence for understanding the irradiation response of PMA SOT-MRAM thin-film stacks, offering a useful reference for interface/barrier optimization of radiation-tolerant SOT-MRAM material stacks.
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来自:
Jin, Mr. yonggan
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分类:
物理学
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核物理学
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备注:
已向《Nuclear Science and Techniques》投稿
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引用:
ChinaXiv:202606.00060
(或此版本
ChinaXiv:202606.00060V1)
DOI:10.12074/202606.00060
CSTR:32003.36.ChinaXiv.202606.00060
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科创链TXID:
3d91e246-2358-4bcc-8f68-86c0973acea0
- 推荐引用方式:
Jin, Mr. yonggan,Cai, Dr. Li,Chen, Mr. Qi-Yu,Chen, Mr. Tianling,Yang, Miss Xiaomeng,Liu, Prof. Jie 刘杰,ye, Mr. bing,Duan, Prof. Jinglai.Heavy-Ion Irradiation Effects on Advanced Perpendicular Magnetic Anisotropy Spin–Orbit Torque Magnetic Random Access Memory Thin Films.null.[DOI:10.12074/202606.00060]
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