Verification for Protection Design of Single Event Lockup with Pulsed Laser

摘要: Pulsed laser testing is a simple, cost-effective, safe, and radiation-free method, offering flexible scheduling, adjustable energy levels, non-destructive testing, and easy operation. It has broad application prospects in simulating single event effects (SEE) in space and has become a mainstream method used domestically and internationally in the past decade, besides the heavy ion accelerator test method. With its ability to accurately target sensitive areas, pulsed laser testing has evolved into a valuable complement to heavy ion experiments, widely used in the performance evaluation of single event effect hardening designs of electronic devices. This paper investigates the single event lockup in image sensors and evaluates the effectiveness of protection strategies using pulsed laser experiments. The research focuses on CMOS APS image sensors, using a focused pulsed laser beam to simulate single event effects. By adjusting the laser's energy and irradiation position, we simulate varying energies and incident angles of SEE, observing the sensor's response. The study provides a detailed analysis of device lockup behavior and evaluates the actual effectiveness of protection methods. The results show that pulsed laser testing offers an effective means to assess the protection strategies against SEE lockup in image sensors. Through comparative experiments, the advantages and disadvantages of the protection strategies in resisting the single event lockup can be clearly seen, thus providing insights for improved designs in practical space applications.